2G HTS tapes are strong candidates for the development of future high magnetic field magnets. However, for such applications, field stability and quality are an issue due to the presence of Screening Current-Induced Field (SCIF) and the large magnetic field drift (FD). We propose here to model the screening currents induced during the ramping of a magnet composed of thousands of turns of 2G HTS tapes. The problem includes the strong coupling between the electromagnetic and mechanical model of the magnet through the critical current density. Thus, the latter does not only depend on the magnetic flux density and its orientation but on the local mechanical deformation as well. It is shown that the hysteresis loop shown by the central magnetic field is strongly dependent on the degradation of the critical current arising from mechanical deformation.